In classical physics, the diffraction phenomenon is described by the Huygens–Fresnel principle that treats each point in a propagating wavefront as a collection of individual spherical wavelets. Infinitely many points (three shown) along length d on the registering plate. Italian scientist Francesco Maria Grimaldi coined the word diffraction and was the first to record accurate observations of the phenomenon in 1660. The diffracting object or aperture effectively becomes a secondary source of the propagating wave. Interaction of phosphotungstate ions with phospholipid monolayers: a synchrotron X-ray study.Not to be confused with refraction, the change in direction of a wave passing from one medium to another.Ī diffraction pattern of a red laser beam projected onto a plate after passing through a small circular aperture in another plateĭiffraction is the interference or bending of waves around the corners of an obstacle or through an aperture into the region of geometrical shadow of the obstacle/aperture. Shimada, T., Furukawa, Y., Arakawa, E., Takeshita, K., Matsushita, T., Yamamoto, H., Koma, A.: Structure determination of ultrathin NbSe 2 films by grazing-incidence X-ray diffraction. Shirasawa, T., Voegeli, W., Nojima, T., Iwasawa, Y., Yamaguchi, Y., Takahashi, T.: Identification of the structure model of the Si(111)-(5 × 2)-Au Surface. Vlieg, E.: Integrated intensities using a six-circle surface x-ray diffractometer. Takahashi, T., Nakatani, S., Ishikawa, T., Kikuta, S.: Surface structure analysis of Si(111)√3 × √3-Bi by X-ray diffraction-approach to the solution of the phase problem. ![]() Tajiri, H., Sakata, O., Takahashi, T.: Surface X-ray diffraction in transmission geometry. Tajiri, H., Takahashi, T.: The phase problem and perspectives of surface X-ray diffraction. Matsushita, T., Iida, A., Takeshita, K., Saito, K., Kuroda, S.-I., Oyanagi, H., Sugi, M., Furukawa, Y.: Grazing incidence x-ray diffraction study of arachidic acid monolayer on cyanine dye aqueous solution. 46, 1081–1084 (1981)įeidenhans’l, R.: Surface structure determination by X-ray diffraction. B 33, 3830–3836 (1986)Įisenberger, P., Marra, W.C.: X-Ray diffraction study of the Ge(001) reconstructed surface. ![]() Robinson, I.K.: Crystal truncation rods and surface roughness. Marra, W.C., Eisenberger, P., Cho, A.Y.: X-ray total-external-reflection–Bragg diffraction: a structural study of the GaAs-Al interface. Springer Series in Surface Sciences, Series Editors: Ertl, G., Lüth, H., Mills, D.L. Sakata, O., Nakamura, M.: Grazing incidence X-ray diffraction. (ed.) Synchrotron Radiation Research: Advances in Surface and Interface Science, vol. ![]() V., Amsterdam (1991)įuoss, P.H., Liang, K.S., Eisenberger, P.: Grazing incidence X-ray scattering. (eds.) Handbook on Synchrotron Radiation, Series Editors: Koch, E.-E., Sasaki, T., Winick, H.
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